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Thesynergy of traditional techniques and deep learning enables single‐framehighprecision fringe pattern analysisA new publication from Opto Electronic Advances, 10.29026/oea.2024.230034 discusses h...

Recently, deep learning has yielded transformative success across optics and photonics, especially in optical metrology. Deep neural networks (DNNs) with a fully convolutional architecture (e.g., U-Ne

Recently, deep learning has yielded transformative success across optics and photonics, especially in optical metrology. Deep neural networks (DNNs) with a fully convolutional architecture (e.g., U-Ne

La métrologie optique, en tant que technique de métrologie à usage général utilisant la lumière comme support d'informations pour des mesures sans contact et non destructives, est fondamentale pour le

Optical metrology, as a general-purpose metrology technique that uses light as information carriers for non-contact and non-destructive measurement, is fundamental to manufacturing, basic research,...

南京理工大学陈钱、左超教授课题组提出了一种结合传统技术与深度学习的单帧高精度条纹图案分析方法。通过将传统单帧条纹分析方法嵌入到深度学习的网络结构和损失函数中,利用可学习的自适应频域滤波直接从单幅条纹图像中恢复出可靠的相位初值,进而引导神经网络实现高精度、高计算效率的相位测量。这项研究表明,基于物理模型的传统技术和数据驱动的深度学习方法协同作用有望为实现快速、高精度的单帧三维成像开辟新途径。

A new publication from Opto-Electronic Advances, 10.29026/oea.2024.230034 discusseshow the synergy of traditional techniques and deep learning enablessingle-frame high-precision fringe pattern anal...

The synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysisA new publication from Opto-Electronic Advances, 10.29026/oea.2024.230034   discus...

Synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysis Fig. 1. Diagrams of the physics-based traditional method, physics-informed deep

Synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysisFig. 1. Diagrams of the physics-based traditional method, physics-informed deep learni...

Synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysisFig. 1. Diagrams of the physics-based traditional method, physics-informed deep learni...

Recently, the research group led by Prof. Qian Chen and Prof. Chao Zuo at the School of Electronic and Optical Engineering, Nanjing University of Science and Technology (NJUST) has published a rese...

近日,南京理工大学陈钱教授、左超教授团队提出了一种基于对向照明实现高分辨率准各向同性三维衍射层析的研究,首次在单个显微成像系统中同时耦合透射角度扫描和反射波长扫描两种照明模式,以扩大光谱支持率,解决由于投影角度有限而导致的缺失锥问题。与仅透射方法相比,该技术使得物函数频谱覆盖支持域突破了单物镜数值孔径的限制,轴向分辨率提升了3倍,最终实现了274 nm的三维准各向同性分辨率。相关研究成果近期作为封

受激辐射超分辨成像技术(stimulated emission depletion microscope-STED)采用一束环形光来通过受激辐射淬灭外围区域的荧光染料,将高斯光束与环形光束重叠得到环形光中心未被淬灭的荧光染料,图像的分辨率与未被淬灭的荧光染料半径有关,半径越小,分辨率越高,所需的淬灭光功率越高,

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