Thesynergy of traditional techniques and deep learning enables single‐framehighprecision fringe pattern analysisA new publication from Opto Electronic Advances, 10.29026/oea.2024.230034 discusses h...
Recently, deep learning has yielded transformative success across optics and photonics, especially in optical metrology. Deep neural networks (DNNs) with a fully convolutional architecture (e.g., U-Ne
Recently, deep learning has yielded transformative success across optics and photonics, especially in optical metrology. Deep neural networks (DNNs) with a fully convolutional architecture (e.g., U-Ne
La métrologie optique, en tant que technique de métrologie à usage général utilisant la lumière comme support d'informations pour des mesures sans contact et non destructives, est fondamentale pour le
Optical metrology, as a general-purpose metrology technique that uses light as information carriers for non-contact and non-destructive measurement, is fundamental to manufacturing, basic research,...
A new publication from Opto-Electronic Advances, 10.29026/oea.2024.230034 discusseshow the synergy of traditional techniques and deep learning enablessingle-frame high-precision fringe pattern anal...
The synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysisA new publication from Opto-Electronic Advances, 10.29026/oea.2024.230034 discus...
Synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysis Fig. 1. Diagrams of the physics-based traditional method, physics-informed deep
Synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysisFig. 1. Diagrams of the physics-based traditional method, physics-informed deep learni...
Synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern analysisFig. 1. Diagrams of the physics-based traditional method, physics-informed deep learni...
Recently, the research group led by Prof. Qian Chen and Prof. Chao Zuo at the School of Electronic and Optical Engineering, Nanjing University of Science and Technology (NJUST) has published a rese...